Sfoglia per Correlatore CARRERA, DIEGO
Mostrati risultati da 1 a 17 di 17
Adaptive-size online dictionary learning for nonstationary environments
2018/2019 GUGLIELMETTI, ANDREA
Adversarially learned anomaly detection using generative adversarial networks
2018/2019 OZGUMUS, SEMSI YIGIT
Convolutional neural networks to reveal patterns in wafer defect maps
2016/2017 MOIOLI, LIDIA
Deep learning content-based image retrieval for TEM images
2020/2021 GATTA, GIUSEPPE GIANMARCO
Enhancing CNN for image denoising by promoting non-local self-similarity
2021/2022 Peretti, Edoardo
Generative adversarial networks and real-time anomaly detection in texture images
2020/2021 PECCHIA, STEFANO
Monitoring HD progression via dictionary learning on cortical surfaces
2016/2017 BERTARINI, ANDREA
Multiple augmented CAM : a general framework for interpreting CNN outputs through image augmentation and multi-frame super-resolution
2019/2020 Strada, Andrea
Neural network training on embedded systems : a feasibility study
2021/2022 Quarantiello, Davide
Object classification and counting with count-ception network
2017/2018 ZHOU, YINAN
Online segmentation of human activity time series
2021/2022 GHIGLIONE, CARLO
Open-set recognition for silicon wafer production monitoring
2020/2021 ILARI, MATTEO
Quantized Reversible Layers for On-Device Neural Networks Training
2022/2023 Pollam, Giovanni Battista
SemiFCDA: semi-supervised federated clustering for domain adaptation
2023/2024 Mesropyan, Taguhi
Toward automatic process window qualification in semiconductor manufacturing through deep learning
2019/2020 MARTINI, MICHELE
Wafer defect map classification using sparse convolutional networks. Models and techniques to solve an industrial challenge
2017/2018 Di BELLA, ROBERTO
Wafer defect map monitoring : model adaptation and inspection tools to handle resolution changes
2018/2019 MORBIDELLI, PIETRO
Mostrati risultati da 1 a 17 di 17
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