Sfoglia per Correlatore CARRERA, DIEGO

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2020-04-29 Tesi di laurea Magistrale Adaptive-size online dictionary learning for nonstationary environments GUGLIELMETTI, ANDREA
2019-07-25 Tesi di laurea Magistrale Adversarially learned anomaly detection using generative adversarial networks OZGUMUS, SEMSI YIGIT
2018-04-19 Tesi di laurea Magistrale Convolutional neural networks to reveal patterns in wafer defect maps MOIOLI, LIDIA
2021-12-21 Tesi di laurea Magistrale Deep learning content-based image retrieval for TEM images GATTA, GIUSEPPE GIANMARCO
2022-07-22 Tesi di laurea Magistrale Enhancing CNN for image denoising by promoting non-local self-similarity Peretti, Edoardo
2021-12-21 Tesi di laurea Magistrale Generative adversarial networks and real-time anomaly detection in texture images PECCHIA, STEFANO
2017-12-21 Tesi di laurea Magistrale Monitoring HD progression via dictionary learning on cortical surfaces BERTARINI, ANDREA
2020-12-15 Tesi di laurea Magistrale Multiple augmented CAM : a general framework for interpreting CNN outputs through image augmentation and multi-frame super-resolution Strada, Andrea
2022-07-22 Tesi di laurea Magistrale Neural network training on embedded systems : a feasibility study Quarantiello, Davide
2018-12-20 Tesi di laurea Magistrale Object classification and counting with count-ception network ZHOU, YINAN
2022-12-20 Tesi di laurea Magistrale Online segmentation of human activity time series GHIGLIONE, CARLO
2022-04-28 Tesi di laurea Magistrale Open-set recognition for silicon wafer production monitoring ILARI, MATTEO
2023-10-05 Tesi di laurea Magistrale Quantized Reversible Layers for On-Device Neural Networks Training Pollam, Giovanni Battista
2024-10-10 Tesi di laurea Magistrale SemiFCDA: semi-supervised federated clustering for domain adaptation Mesropyan, Taguhi
2021-04-28 Tesi di laurea Magistrale Toward automatic process window qualification in semiconductor manufacturing through deep learning MARTINI, MICHELE
2019-04-16 Tesi di laurea Magistrale Wafer defect map classification using sparse convolutional networks. Models and techniques to solve an industrial challenge Di BELLA, ROBERTO
2019-10-03 Tesi di laurea Magistrale Wafer defect map monitoring : model adaptation and inspection tools to handle resolution changes MORBIDELLI, PIETRO
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