Optimization of the test board design for a radiation detection module using CdZnTe pixel detector and CMOS ASICs

In the recent years, CdZnTe crystals have routinely been grown by the boron oxide encapsulated vertical Bridgman technique. In this work, it is shown that linear array detectors have been prepared based on this material. The detectors show good spectroscopic characteristics and no polarization effects, meeting the requirements for the realization of high throughput, multi-energy scanners. The detectors show low leakage current and have been coupled to a specifically designed research-grade low noise ASIC. This read-out ASIC has been developed for such a system and features 16 channels of electronics, each with a Pre-amplifier, CR-RC shaper, and peak-stretcher. The energy, signal rise time, and timestamp of any hit channel is read out together with the data. A readout board is designed for better testing purpose and to verify results of CdZnTe detector and its readout ASIC electronics. At hand GUI is also created for feasibility in testing procedures. These all developments are accomplished by using advance tools like LabVIEW, KEIL µVision and DxDesigner. By using these advanced testing environment new goals can be achieved with more accuracy and less difficulty.