A novel method based on a statistical approach for the testing of Photonic Integrated Devices (PIC) is presented. This method aims to strongly cut the time and equipment costs currently present in the testing procedures for this typology of devices, being these the major causes of the testing impact on the total production’s cost. The proposed method exploits the well-known Principal Component Analysis (PCA) statistical approach to obtain information about the overall device quality reducing time and equipment costs. The effectiveness of the proposed method and its limitations were tested by simulations of a 4-ports Free Spectral Range (FSR)-free silicon pho tonics filter. In order to perform an interesting validation of the method, different kinds of perturbation were modelled and applied to the simulated filters.
Un metodo innovativo basato su un approccio statistico per il testing di circuiti di fotonica integrata (PICs) è presentato. Questo metodo mira a tagliare fortemente i costi di tempo ed attrezzatura presenti oggigiorno nelle procedure di testing per questa tipologia di dispositivi, essendo queste le cause principali dell’impatto del testing sul costo totale di produzione. Il metodo proposto sfrutta il ben noto approccio statistico "Analisi delle componenti principali" (PCA) per ottenere informazioni sulla qualità del dispositivo riducendo i costi di tempo ed attrezzatura. L’efficacia del metodo proposto e i suoi limiti sono stati testati tramite simulazioni di un filtro di silicon photonics a 4 porte Free Spectral Range (FSR)-free su cui diversi tipi di perturbazione sono stati applicati. Al fine di compiere un’interessante validazione del metodo, diversi tipi di perturbazione sono stati modellizzati e applicati ai filtri simulati.
Testing techniques for photonic integrated circuits with statistical approach
Montali, Dario
2020/2021
Abstract
A novel method based on a statistical approach for the testing of Photonic Integrated Devices (PIC) is presented. This method aims to strongly cut the time and equipment costs currently present in the testing procedures for this typology of devices, being these the major causes of the testing impact on the total production’s cost. The proposed method exploits the well-known Principal Component Analysis (PCA) statistical approach to obtain information about the overall device quality reducing time and equipment costs. The effectiveness of the proposed method and its limitations were tested by simulations of a 4-ports Free Spectral Range (FSR)-free silicon pho tonics filter. In order to perform an interesting validation of the method, different kinds of perturbation were modelled and applied to the simulated filters.File | Dimensione | Formato | |
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2021_12_Montali.pdf
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Descrizione: executive summary and thesis
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https://hdl.handle.net/10589/183525